publication venue for
- Scanning Electron Microscope 3D Surface Reconstruction via Optimization. 25:224-225. 2019
- Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes. 25:254-255. 2019
- Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing. 25:705-710. 2019
- Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model. 24:657-666. 2018
- Plasma Focused Ion Beam Curtaining Artifact Correction by Fourier-Based Linear Opti-mization Model. 24:588-589. 2018
- Structure-properties relationship of ultra-fine grained V-microalloyed dual phase steels. 24:2232-2233. 2018
- The Role of Spatial Coherence for the Creation of Atom Size Electron Vortex Beams. 24:920-921. 2018
- Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale. 24:170-171. 2018
- Optimization of Three-Dimensional (3D) Chemical Imaging by Soft X-Ray Spectro-Tomography Using a Compressed Sensing Algorithm. 23:951-966. 2017
- Three-dimensional Confocal Imaging Using Coherent Elastically Scattered Electrons. 23:450-451. 2017
- Interface Segregation and Nitrogen Measurement in Fe–Mn–N Steel by Atom Probe Tomography. 23:385-395. 2017
- Every Atom has a Story to Tell: Using Single-Atom-Sensitivity Imaging and Spectroscopy to Determine Origins of Cosmic Nanodiamonds. 22:866-867. 2016
- High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector. 22:980-981. 2016
- Biomineralization at Interfaces Revealed with 4D Electron and Atom Probe Tomographies. 21:83-84. 2015
- Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials. 21:1427-1428. 2015
- Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution. 21:2175-2176. 2015
- Thermally Driven Cation Exchange at Solid State between Cu2Se and CdSe Nanocrystals: an In-Situ TEM Study. 21:947-948. 2015
- 3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite. 20:318-319. 2014
- Coordinated Microanalyses of Seven Particles of Probable Interstellar Origin from the Stardust Mission.. 20:1692-1693. 2014
- Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications. 20:770-771. 2014
- Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures. 20:1064-1065. 2014
- FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography. 20:352-353. 2014
- Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures. 20:358-359. 2014
- From Micro to Nano: Correlative 3D Microscopies for Analysis of Biointerfaces. 20:962-963. 2014
- Response to: On the First Application of the Richardson–Lucy Algorithm to Resolve Plasmonic Resonances in EELS Spectra Obtained with a Monochromated Electron Beam. 20:995-995. 2014
- A “Thickness Series”: Weak Signal Extraction of ELNES in EELS Spectra From Surfaces. 20:649-657. 2014
- Toward 10 meV Electron Energy-Loss Spectroscopy Resolution for Plasmonics. 20:767-778. 2014
- Synchrotron-Based Chemical Nano-Tomography of Microbial Cell-Mineral Aggregates in their Natural, Hydrated State. 20:531-536. 2014
- Chemically selective imaging and spectroscopy with Scanning Transmission X-ray Microscopy. 19:2038-2039. 2013
- Focused Ion Beam Slice-and-View Tomography and Correlative Electron Microscopy of Multiphase Meteorite Particles. 19:870-871. 2013
- Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications. 18:336-337. 2012
- Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies. 18:846-847. 2012
- FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors. 18:1806-1807. 2012
- Instabilities in scanning probe images of periodic structures: detection and corrections. 18:378-379. 2012
- Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy. 18:1820-1821. 2012
- Recent advances in Scanning Transmission X-ray Microscopy. 18:966-967. 2012
- Scanning Transmission Electron Microscopy (STEM) Tomography of Layer-by-Layer PAH/PSS-Au Nanocomposite Structures. 17:1012-1013. 2011
- Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM. 16:416-424. 2010
- Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si. 16:1338-1339. 2010
- Applications of spherical aberration correction in STEM and TEM. 16:68-69. 2010
- Coordinated XANES, TEM and SIMS Analysis of the Chemistry, Microstructure and Isotopic Composition of Insoluble Organics in Meteorites. 16:926-927. 2010
- Detecting and Correcting Instabilities in STEM Images. 16:762-763. 2010
- Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam. 15:342-343. 2009
- Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit. 14:469-477. 2008
- Investigation of the Hexagonal Perovskite Ba3Ti2RuO9 using High Resolution STEM and High Resolution EELS. 14:1342-1343. 2008
- Study of FIB Damage in Carbonaceous Materials using XANES. 14:1008-1009. 2008
- Quantitative Energy Dispersive X-ray Microanalysis of Electron Beam-Sensitive Alloyed Nanoparticles. 14:166-175. 2008
- Electron Energy Loss Near-Edge Structures in Complex Perovskites. 13:1288-1289. 2007
- Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides. 12:114-115. 2006
- High Resolution EELS Investigation Of Hexagonal Transition Metal Perovskites. 11:738-739. 2005
- Energy-loss Near-edge Structure (ELNES) of Hexagonal and Cubic GaN. 10:884-885. 2004
- Materials Science Applications Of A Monochromated TEM. 9:112-113. 2003
- Electron Microscopy and Interface Plasmons Characterization of Cadmium Telluride Thin Film Grown Incommensurately with Weak Bonding on Sapphire 2020
- Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table 2016
- Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution 2014
- Effects of Sample Preparation Technique on Quantitative Analysis of Automotive Fuel Cell Catalyst Layers 2014
- In situ Methods for Analysis of Polymer Electrolyte Membrane Fuel Cell Materials by Soft X-ray Scanning Transmission X-ray Microscopy 2014
- Probing Magnetic Polarities of Magnetotactic Bacteria by X-ray Magnetic Circular Dichroism in a Scanning Transmission X-ray Microscope 2014
- TEM Study of Supercritical Water Corrosion in 310S and 800H Alloys 2014
- High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures 2011
- Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials 2009
- Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration 2009
- Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy 2009
- Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM 2009
- Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry 2008
- Chemical Imaging by Soft X-ray Scanning Transmission X-ray Microscopy 2006
- Chemically Sensitive Tomography at 50 nm Spatial Resolution using a Soft X-ray Scanning Transmission X-Ray Microscope 2006
- Fabrication and Morphology of ZnO and ZnS Nanoribbon Heterostructure 2006
- Morphology, Electronic and Optical Properties of Si Nanowires 2006
- Methods and Examples of Quantitative Chemical Mapping using Synchrotron Soft X-ray Spectromicroscopy 2004
- Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities 2004
- Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Dielectrics Deposited by MOCVD using [(C2H5)2N]4Hf with NO and O2 2004
- Application of FIB to Metal Alloy TEM Sample Preparation 2003
- Evolution Of Microstructure During Solidification Of Al-Si Cast Alloys 2003
- Preparation of Transmission Electron Microscope Specimens from Ultra-Fine Fibers by a FIB Technique 2003
- Materials science applications of a monochromated TEM 2003
- Detection and Localization of Gd-DTPA Following Dynamic Contrast Enhanced Magnetic Resonance Imaging (dMRI) Using Cryo Field Emission Scanning Electron Microscopy (FESEM) and Energy Dispersive X-ray Spectrometry (EDS) 2002
- Probing the Metal-Insulator Transitions in Complex Oxides with EELS Near- Edge Structures 2002