Journal article
EELS at Very High Energy Losses - an Opportunity to Provide Complementary Information to X-ray Absorption Spectroscopy (XAS)
Authors
Lazar S; Meledina M; Schnohr C; Hoeche T; Tiemeijer P; Longo P; Freitag B
Journal
Microscopy and Microanalysis, Vol. 29, No. Supplement_1, pp. 369–370
Publisher
Oxford University Press (OUP)
Publication Date
July 22, 2023
DOI
10.1093/micmic/ozad067.172
ISSN
1431-9276