Journal article
Comparison Between Moiré Sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis Strain Characterization Method and Dark-Field Electron Holography
Authors
Pofelski A; Whabi V; Ghanad-Tavakoli S; Botton G
Journal
Microscopy and Microanalysis, Vol. 27, No. S1, pp. 1982–1984
Publisher
Oxford University Press (OUP)
Publication Date
August 2021
DOI
10.1017/s1431927621007224
ISSN
1431-9276