Journal article
Large Field of View Strain Characterization in a Scanning Transmission Electron Microscope Using a Designed Coherent Sampler
Authors
Pofelski A; Ghanad-Tavakoli S; Thompson DA; Botton GA
Journal
Microscopy and Microanalysis, Vol. 25, No. S2, pp. 86–87
Publisher
Oxford University Press (OUP)
Publication Date
August 1, 2019
DOI
10.1017/s1431927619001168
ISSN
1431-9276