Journal article
Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Authors
Hitchcock A; Leung B; Brash J; Najafi E; Rossouw D; Botton G
Journal
Microscopy and Microanalysis, Vol. 18, No. S2, pp. 846–847
Publisher
Oxford University Press (OUP)
Publication Date
July 2012
DOI
10.1017/s1431927612006083
ISSN
1431-9276