Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies Journal Articles

Overview
Research
Identity
Additional Document Info
View All

abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

authors

Hitchcock, Adam Percival
Leung, B
Brash, John
Najafi, E
Rossouw, D
Botton, Gianluigi

status

published

publication date

July 2012

has subject area

0204 Condensed Matter Physics (FoR)
0601 Biochemistry and Cell Biology (FoR)
0912 Materials Engineering (FoR)
Microscopy (Science Metrix)

published in

Microscopy and Microanalysis Journal