Journal article
Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing
Abstract
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs. These unwanted, aperiodic features extend the image along a primary direction and occupy a small wedge of information in Fourier space. Deleting this wedge of data replaces stripes, scratches, or curtaining, with more complex streaking and blurring artifacts-known within the …
Authors
Schwartz J; Jiang Y; Wang Y; Aiello A; Bhattacharya P; Yuan H; Mi Z; Bassim N; Hovden R
Journal
Microscopy and Microanalysis, Vol. 25, No. 3, pp. 705–710
Publisher
Oxford University Press (OUP)
Publication Date
June 2019
DOI
10.1017/s1431927619000254
ISSN
1431-9276