Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures Journal Articles

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abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

authors

Gauquelin, N
Couillard, M
Zhang, H
Wei, J
Botton, Gianluigi

status

published

publication date

July 2011

has subject area

0204 Condensed Matter Physics (FoR)
0601 Biochemistry and Cell Biology (FoR)
0912 Materials Engineering (FoR)
Microscopy (Science Metrix)

published in

Microscopy and Microanalysis Journal