Scholarly Works

Aberration-Corrected STEM and Atomic EELS Imaging...

Journal article

Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Authors

Gauquelin N; Couillard M; Zhang H; Wei J; Botton G

Journal

Microscopy and Microanalysis, Vol. 17, No. S2, pp. 1320–1321

Publisher

Oxford University Press (OUP)

Publication Date

July 1, 2011

DOI

10.1017/s1431927611007471

ISSN

1431-9276

Associated Experts

Gianluigi Botton

Professor Emeritus, Faculty of Engineering

Labels

Fields of Research (FoR)

3101 Biochemistry and cell biology 40 Engineering 4016 Materials engineering 31 Biological Sciences

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