Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit Academic Article uri icon

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abstract

  • AbstractThe ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution. These results mark an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.

authors

  • Kisielowski, C
  • Freitag, B
  • Bischoff, M
  • van Lin, H
  • Lazar, Sorin
  • Knippels, G
  • Tiemeijer, P
  • van der Stam, M
  • von Harrach, S
  • Stekelenburg, M
  • Haider, M
  • Uhlemann, S
  • Müller, H
  • Hartel, P
  • Kabius, B
  • Miller, D
  • Petrov, I
  • Olson, EA
  • Donchev, T
  • Kenik, EA
  • Lupini, AR
  • Bentley, J
  • Pennycook, SJ
  • Anderson, IM
  • Minor, AM
  • Schmid, AK
  • Duden, T
  • Radmilovic, V
  • Ramasse, QM
  • Watanabe, M
  • Erni, R
  • Stach, EA
  • Denes, P
  • Dahmen, U

publication date

  • October 2008