Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration Conferences

Overview
Research
Identity
Additional Document Info
View All

abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

authors

Chang, L-Y
Lazar, Sorin
Bártová, B
Botton, Gianluigi
Hébert, C
Morral, A Fontcuberta I

status

published

publication date

July 2009

has subject area

0204 Condensed Matter Physics (FoR)
0601 Biochemistry and Cell Biology (FoR)
0912 Materials Engineering (FoR)
Microscopy (Science Metrix)

published in

Microscopy and Microanalysis Journal