Conference
Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Authors
Chang L-Y; Lazar S; Bártová B; Botton G; Hébert C; Morral AFI
Volume
15
Pagination
pp. 138-139
Publisher
Oxford University Press (OUP)
Publication Date
July 2009
DOI
10.1017/s1431927609096470
Conference proceedings
Microscopy and Microanalysis
Issue
S2
ISSN
1431-9276