Conference
Electron Microscopy and Interface Plasmons Characterization of Cadmium Telluride Thin Film Grown Incommensurately with Weak Bonding on Sapphire
Authors
El-Sherif H; Jovanovic S; Preston J; Basim N
Volume
26
Pagination
pp. 3116-3118
Publisher
Oxford University Press (OUP)
Publication Date
January 1, 2020
DOI
10.1017/s1431927620023867
Conference proceedings
Microscopy and Microanalysis
Issue
S2
ISSN
1431-9276