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Quantitative Characterisation of Surface Defects...
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Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Authors

Chang L-Y; Lazar S; Baranova E; Bock C; Botton G

Volume

15

Pagination

pp. 1416-1417

Publisher

Oxford University Press (OUP)

Publication Date

July 1, 2009

DOI

10.1017/s1431927609094744

Conference proceedings

Microscopy and Microanalysis

Issue

S2

ISSN

1431-9276

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