Journal article
Some Quantification Problems in Parallel EELS Images
Abstract
The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial …
Authors
Botton G; L’Espérance G; Ball MD; Gallerneault CE
Journal
Microscopy and Microanalysis, Vol. 48, No. 2, pp. 36–37
Publisher
Cambridge University Press (CUP)
Publication Date
August 12, 1990
DOI
10.1017/s0424820100133771
ISSN
1431-9276