Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications Academic Article uri icon

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abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

authors

  • Nan, F
  • Hosseini Vajargah, S
  • Rossouw, D
  • Woo, SY
  • Bugnet, M
  • Chan, MC
  • Gauquelin, N
  • Stambula, S
  • Zhu, G
  • Botton, Gianluigi

publication date

  • July 2012