Journal article
Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Authors
Nan F; Vajargah SH; Rossouw D; Woo S; Bugnet M; Chan M; Gauquelin N; Stambula S; Zhu G; Botton G
Journal
Microscopy and Microanalysis, Vol. 18, No. S2, pp. 336–337
Publisher
Oxford University Press (OUP)
Publication Date
7 2012
DOI
10.1017/s1431927612003534
ISSN
1431-9276