Journal article
Correlative Electron Microscopy Enables Scalable Characterization of 2D half-van der Waals Heterostructures
Authors
El-Sherif H; Briggs N; Robinson J; Bassim N
Journal
Microscopy and Microanalysis, Vol. 27, No. S1, pp. 636–638
Publisher
Oxford University Press (OUP)
Publication Date
August 1, 2021
DOI
10.1017/s1431927621002671
ISSN
1431-9276