Journal article
Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Authors
Botton G; Wu M-Y; Maunders C; Etheridge J; Whitfield H
Journal
Microscopy and Microanalysis, Vol. 10, No. S02, pp. 86–87
Publisher
Oxford University Press (OUP)
Publication Date
August 2004
DOI
10.1017/s1431927604887543
ISSN
1431-9276