Journal article
FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography
Authors
Huang J; Wang X; Grandfield K
Journal
Microscopy and Microanalysis, Vol. 20, No. S3, pp. 352–353
Publisher
Oxford University Press (OUP)
Publication Date
August 1, 2014
DOI
10.1017/s1431927614003481
ISSN
1431-9276