Journal article
Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Authors
Bassim N; De Gregorio B; Kilcoyne A; Scott K; Chou T; Wirick S; Cody G; Fischione P; Liu J; Stroud R
Journal
Microscopy and Microanalysis, Vol. 15, No. S2, pp. 342–343
Publisher
Oxford University Press (OUP)
Publication Date
July 2009
DOI
10.1017/s143192760909878x
ISSN
1431-9276