Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam Journal Articles uri icon

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abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

authors

  • Bassim, Nabil
  • Gregorio, B De
  • Kilcoyne, AD
  • Scott, K
  • Chou, T
  • Wirick, S
  • Cody, G
  • Fischione, PE
  • Liu, J
  • Stroud, R

publication date

  • July 2009