Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si Academic Article uri icon

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abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

authors

  • Vajargah, SH
  • Couillard, M
  • Shao, Y
  • Tavakoli, S
  • Kleiman, Rafael
  • Preston, J
  • Botton, GA

publication date

  • July 2010