Aberration-Corrected TEM Study of Defects in III-V...

Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Vajargah S; Couillard M; Shao Y; Tavakoli S; Kleiman R; Preston J; Botton G

Microscopy and Microanalysis, Vol. 16, No. S2, pp. 1338–1339

Oxford University Press (OUP)

July 1, 2010

10.1017/s1431927610062033

1431-9276

Gianluigi Botton

John Stewart Preston

Rafael Kleiman