FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors Academic Article uri icon

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abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

authors

  • Bassim, Nabil
  • Aifer, A
  • Jackson, E
  • Nolde, J
  • Affouda, C
  • Canedy, C
  • Vurgaftman, I
  • Meyer, J
  • Maximenko, S

publication date

  • July 2012