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Measurement of Indium-Content Variation in...

Journal article

Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Authors

Woo S; Gauquelin N; Botton G; Turner S; Mi Z

Journal

Microscopy and Microanalysis, Vol. 18, No. S2, pp. 1820–1821

Publisher

Oxford University Press (OUP)

Publication Date

January 1, 2012

DOI

10.1017/s1431927612010951

ISSN

1431-9276

Associated Experts

Gianluigi Botton

Professor Emeritus, Faculty of Engineering

Labels

Fields of Research (FoR)

3101 Biochemistry and cell biology 40 Engineering 4016 Materials engineering 31 Biological Sciences

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