Journal article
STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
Authors
Lovejoy T; Stroud R; Bassim N; Corbin G; Dellby N; Hahn W; Hrncirik P; Falke M; Kaeppel A; Rohde M
Journal
Microscopy and Microanalysis, Vol. 21, No. S3, pp. 339–340
Publisher
Oxford University Press (OUP)
Publication Date
August 2015
DOI
10.1017/s1431927615002494
ISSN
1431-9276