Journal article
Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications
Authors
Marsh M; Scott K; Stroud R; Bassim N
Journal
Microscopy and Microanalysis, Vol. 20, No. S3, pp. 770–771
Publisher
Oxford University Press (OUP)
Publication Date
August 1, 2014
DOI
10.1017/s1431927614005571
ISSN
1431-9276