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A “Thickness Series”: Weak Signal Extraction of...
Journal article

A “Thickness Series”: Weak Signal Extraction of ELNES in EELS Spectra From Surfaces

Abstract

We report a new simple but effective method to extract the weak surface signals from a "thickness series" of recorded electron energy-loss spectra. Using precise thickness measurements and energy-loss near-edge structures measured at increasing thicknesses, we are able to extract the surface and bulk components in the series. The electronic structure and bonding information from SrTiO3 (001) reconstructed surfaces have been successfully obtained by applying this approach. This approach can be applied to study many other cases including absorbed monolayers and beam-sensitive interfaces.

Authors

Zhu G-Z; Botton GA

Journal

Microscopy and Microanalysis, Vol. 20, No. 3, pp. 649–657

Publisher

Oxford University Press (OUP)

Publication Date

June 1, 2014

DOI

10.1017/s1431927613013676

ISSN

1431-9276

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