Journal article
Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM
Abstract
High-angle annular dark-field and annular bright-field imaging experiments were carried out on an aberration-corrected transmission electron microscope. These techniques have been demonstrated on thin films of complex oxides Ba3.25La0.75Ti3O12 and on LaB6. The results show good agreement between theory and experiments, and for the case of LaB6 they demonstrate the detection of contrast from the B atoms in the annular bright-field images. …
Authors
Lazar S; Shao Y; Gunawan L; Nechache R; Pignolet A; Botton GA
Journal
Microscopy and Microanalysis, Vol. 16, No. 4, pp. 416–424
Publisher
Oxford University Press (OUP)
Publication Date
August 2010
DOI
10.1017/s1431927610013504
ISSN
1431-9276