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Journal article

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Authors

Chang L; Maunders C; Baranova E; Bock C; Botton G

Journal

Microscopy and Microanalysis, Vol. 14, No. S2, pp. 426–427

Publisher

Oxford University Press (OUP)

Publication Date

August 1, 2008

DOI

10.1017/s1431927608086728

ISSN

1431-9276

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