Journal article
Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution
Authors
Zheng C; Zhu Y; Lazar S; Etheridge J
Journal
Microscopy and Microanalysis, Vol. 21, No. S3, pp. 2175–2176
Publisher
Oxford University Press (OUP)
Publication Date
August 2015
DOI
10.1017/s1431927615011654
ISSN
1431-9276