Journal article
Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Authors
Hitchcock A; Tyliszczak T; Obst M; Swerhone G; Lawrence J
Journal
Microscopy and Microanalysis, Vol. 16, No. S2, pp. 924–925
Publisher
Oxford University Press (OUP)
Publication Date
July 2010
DOI
10.1017/s1431927610054899
ISSN
1431-9276