publication venue for
- MSiT: A Cross-Machine Fault Diagnosis Model for Machine-Level CNC Spindle Motors. 73:792-802. 2024
- Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test. 70:1355-1367. 2021
- Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model. 69:937-953. 2020
- Two-Phase Degradation Process Model With Abrupt Jump at Change Point Governed by Wiener Process. 66:1345-1360. 2017
- Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data. 66:641-650. 2017
- Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model. 65:957-968. 2016
- EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. 65:973-991. 2016
- Exact Nonparametric Meta-Analysis of Lifetime Data From Systems With Known Signatures. 65:796-801. 2016
- A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. 65:469-485. 2016
- Exact Inference for Laplace Quantile, Reliability, and Cumulative Hazard Functions Based on Type-II Censored Data. 65:164-178. 2016
- Exact Nonparametric Inference for Component and System Lifetime Distributions Based on Joint Signatures. 65:179-186. 2016
- Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. 65:446-458. 2016
- Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data. 64:627-635. 2015
- Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process. 64:603-612. 2015
- Statistical Inference of Component Lifetimes With Location-Scale Distributions From Censored System Failure Data With Known Signature. 64:613-626. 2015
- Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process. 64:463-472. 2015
- Reliability Inference on Composite Dynamic Systems Based on Burr Type-XII Distribution. 64:144-153. 2015
- Stochastic Comparisons of Series and Parallel Systems With Generalized Exponential Components. 64:333-348. 2015
- Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution. 63:944-952. 2014
- Likelihood Inference Based on Left Truncated and Right Censored Data From a Gamma Distribution. 62:679-688. 2013
- Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress. 62:537-551. 2013
- A Meta-Analysis of Multisample Type-II Censored Data With Parametric and Nonparametric Results. 62:2-12. 2013
- Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution. 61:809-821. 2012
- Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. 61:604-613. 2012
- A General Purpose Approximate Goodness-of-Fit Test for Progressively Type-II Censored Data. 61:238-244. 2012
- A Proposed Measure of Residual Life of Live Components of a Coherent System. 61:41-49. 2012
- Goodness-of-Fit Test Based on Kullback-Leibler Information for Progressively Type-II Censored Data. 60:570-579. 2011
- Modeling Parameters of a Load-Sharing System Through Link Functions in Sequential Order Statistics Models and Associated Inference. 60:605-611. 2011
- Linear Inference for Type-II Censored Lifetime Data of Reliability Systems With Known Signatures. 60:426-440. 2011
- Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process. 60:234-245. 2011
- Minimum-Distance Parametric Estimation Under Progressive Type-I Censoring. 59:413-425. 2010
- Mean Residual Life Function, Associated Orderings and Properties. 59:55-65. 2010
- Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. 58:611-618. 2009
- Order Restricted Inference for Exponential Step-Stress Models. 58:132-142. 2009
- A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples. 57:633-642. 2008
- Inference for a Simple Step-Stress Model With Type-II Censoring, and Weibull Distributed Lifetimes. 57:616-626. 2008
- Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data. 56:301-307. 2007
- Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring. 55:613-614. 2006
- Correction to "A Comparison of Two Simple Prediction Intervals for Exponential Distribution". 54:366-366. 2005
- A Comparison of Two Simple Prediction Intervals for Exponential Distribution. 54:27-33. 2005
- Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution. 53:349-356. 2004
- Optimal Step-Stress Test Under Progressive Type-I Censoring. 53:388-393. 2004
- Point and interval estimation for Gaussian distribution, based on progressively type-II censored samples. 52:90-95. 2003
- Reliability sampling plans for lognormal distribution, based on progressively-censored samples. 49:199-203. 2000
- Correction to 'Approximate MLE of the scale parameter of the Rayleigh distribution with censoring' (Aug 89 355-357). 41:271. 1992
- Approximate MLEs for the location and scale parameters of the extreme value distribution with censoring. 40:146-151. 1991
- Approximate MLEs for the location and scale parameters of the half-logistic distribution with type-II right-censoring. 40:140-145. 1991
- Approximate MLE of the scale parameter of the Rayleigh distribution with censoring. 38:355-357. 1989
- A Computational Technique For Maximum Likelihood Estimation With Weibull Models. R-29:57-62. 1980