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Journal article

Reliability sampling plans for lognormal distribution, based on progressively-censored samples

Abstract

This paper presents reliability sampling plans for the lognormal distribution based on progressively censored samples. In constructing these sampling plans, large-sample approximations to the best linear unbiased estimators of the location and scale parameters are used. For some selected progressive censoring schemes, reliability sampling plans are tabulated for p/sub /spl alpha// and p/sub /spl beta// to match MIL-STD-105. While in general, variable-sampling plans require smaller sample size when compared with attribute-sampling plans, the ordinary complete and right-censored life test experiments are special cases of the progressively censored experiment. Hence, the progressively censored reliability sampling plans in this paper are widely applicable. General application of the procedure is discussed, and two examples are provided.

Authors

Balasooriya U; Balakrishnan N

Journal

IEEE Transactions on Reliability, Vol. 49, No. 2, pp. 199–203

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 2000

DOI

10.1109/24.877338

ISSN

0018-9529

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