Journal article
Reliability sampling plans for lognormal distribution, based on progressively-censored samples
Abstract
Authors
Balasooriya U; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 49, No. 2, pp. 199–203
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2000
DOI
10.1109/24.877338
ISSN
0018-9529