Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution
Journal Articles
- Overview
- Research
- Identity
- Additional Document Info
- View All
Overview
status
publication date
- December 2014
has subject area
- 0803 Computer Software (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- Operations Research (Science Metrix)
published in
- IEEE Transactions on Reliability Journal