Journal article
Goodness-of-Fit Test Based on Kullback-Leibler Information for Progressively Type-II Censored Data
Abstract
Authors
Rad AH; Yousefzadeh F; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 60, No. 3, pp. 570–579
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2011
DOI
10.1109/tr.2011.2162470
ISSN
0018-9529