Journal article
Mean Residual Life Function, Associated Orderings and Properties
Abstract
Authors
Nanda AK; Bhattacharjee S; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 59, No. 1, pp. 55–65
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2010
DOI
10.1109/tr.2009.2035791
ISSN
0018-9529