Reliability Analysis of Cyclic Accelerated Life Test Data Using Log-Location-Scale Family of Distributions Under Censoring With Application to Solder Joint Data
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Overview
publication date
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Research
keywords
Accelerated life-test
Computer Science
Computer Science, Hardware & Architecture
Computer Science, Software Engineering
Costs
DEGRADATION TESTS
DESIGN
Data models
Engineering
Engineering, Electrical & Electronic
Fatigue
Life estimation
Linear regression
MODEL
Maximum likelihood estimation
Norris-Landzberg model
Reliability
Science & Technology
Shape
Stress
Technology
Vibrations
WEIBULL
best linear unbiased estimator
cyclic tests
log-location-scale family
test of solder joints data
type-II censoring
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