Journal article
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process
Abstract
Authors
Ling MH; Tsui KL; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 64, No. 1, pp. 463–472
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2015
DOI
10.1109/tr.2014.2337071
ISSN
0018-9529