Journal article
Exact Nonparametric Meta-Analysis of Lifetime Data from Systems with Known Signatures
Abstract
Authors
Volterman W; Balakrishnan N; Davies KF; Ng HKT
Journal
IEEE Transactions on Reliability, Vol. 65, No. 2, pp. 796–801
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2016
DOI
10.1109/tr.2015.2494362
ISSN
0018-9529