Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress
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Overview
status
publication date
- June 2013
has subject area
- 0803 Computer Software (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- Operations Research (Science Metrix)
published in
- IEEE Transactions on Reliability Journal