Journal article
Optimal Design for Degradation Tests based on Gamma Processes with Random Effects
Abstract
Authors
Tsai C-C; Tseng S-T; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 604–613
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/tr.2012.2194351
ISSN
0018-9529