Journal article
Iterative Regression Algorithm for Parameter Estimation for Nondestructive One-Shot Devices Under Cyclic Accelerated Life Test With Adaptive Proportion of Failure Design
Abstract
Authors
Zhang W; Zhu X; He M; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 74, No. 4, pp. 4692–4703
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2025
DOI
10.1109/tr.2025.3589325
ISSN
0018-9529