Journal article
Statistical Inference of Component Lifetimes with Location-Scale Distributions from Censored System Failure Data with Known Signature
Abstract
Authors
Zhang J; Ng KT; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 64, No. 2, pp. 613–626
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2015
DOI
10.1109/tr.2015.2417373
ISSN
0018-9529