Journal article
Corrections on “Optimal Step-Stress Test Under Progressive Type-I Censoring”
Abstract
Authors
Han D; Balakrishnan N; Sen A; Gouno E
Journal
IEEE Transactions on Reliability, Vol. 55, No. 4, pp. 613–614
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2006
DOI
10.1109/tr.2006.884601
ISSN
0018-9529