Journal article
Inference for a Simple Step-Stress Model with Type-II Censoring, and Weibull Distributed Lifetimes
Abstract
Authors
Kateri M; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 57, No. 4, pp. 616–626
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2008
DOI
10.1109/tr.2008.2006292
ISSN
0018-9529