Journal article
A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Abstract
Authors
Balakrishnan N; Lin C-T; Chan P-S
Journal
IEEE Transactions on Reliability, Vol. 54, No. 1, pp. 27–33
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2005
DOI
10.1109/tr.2004.841727
ISSN
0018-9529