Journal article
Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Abstract
Authors
Balakrishnan N; Ng HKT; Kannan N
Journal
IEEE Transactions on Reliability, Vol. 53, No. 3, pp. 349–356
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2004
DOI
10.1109/tr.2004.833317
ISSN
0018-9529