Journal article
Approximate MLEs for the location and scale parameters of the extreme value distribution with censoring
Abstract
Authors
Balakrishnan N; Varadan J
Journal
IEEE Transactions on Reliability, Vol. 40, No. 2, pp. 146–151
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 1991
DOI
10.1109/24.87115
ISSN
0018-9529