Journal article
Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data
Abstract
Authors
Noughabi HA; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 64, No. 2, pp. 627–635
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2015
DOI
10.1109/tr.2014.2366763
ISSN
0018-9529