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Journal article

Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data

Abstract

In this article, a general goodness of fit test is developed by using a new estimate of Kullback-Leibler (KL) information based on Type-II censored data. The proposed test is consistent, and the test statistic is nonnegative, just like KL information. Then, the test statistic is used to test for exponentiality based on Type-II censored data. Through a simulation study, power values of the proposed test are compared with some prominent existing tests. A real-life data analysis is finally presented for illustrative purpose.

Authors

Noughabi HA; Balakrishnan N

Journal

IEEE Transactions on Reliability, Vol. 64, No. 2, pp. 627–635

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

June 1, 2015

DOI

10.1109/tr.2014.2366763

ISSN

0018-9529

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