Journal article
Testing Exponentiality Based on Kullback-Leibler Information with Progressively Type-II Censored Data
Abstract
Authors
Balakrishnan N; Rad AH; Arghami NR
Journal
IEEE Transactions on Reliability, Vol. 56, No. 2, pp. 301–307
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2007
DOI
10.1109/tr.2007.895308
ISSN
0018-9529