Journal article
Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process
Abstract
Burn-in test is a manufacturing process applied to products to eliminate latent failures or weak components in the factory before the products reach customers. The traditional burn-in test over a short period of time to collect time-to-failure or go/no-go data is rather inefficient. This decision problem can be solved if there exists a suitable quality characteristic (QC) whose degradation over time can be related to the lifetime of the …
Authors
Tsai C-C; Tseng S-T; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 234–245
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2011
DOI
10.1109/tr.2010.2087430
ISSN
0018-9529