Journal article
A Meta-Analysis of Multisample Type-II Censored Data with Parametric and Nonparametric Results
Abstract
Authors
Balakrishnan N; Volterman W; Zhang L
Journal
IEEE Transactions on Reliability, Vol. 62, No. 1, pp. 2–12
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2013
DOI
10.1109/tr.2013.2240876
ISSN
0018-9529