Journal article
Linear Inference for Type-II Censored Lifetime Data of Reliability Systems with Known Signatures
Abstract
Authors
Balakrishnan N; Ng KT; Navarro J
Journal
IEEE Transactions on Reliability, Vol. 60, No. 2, pp. 426–440
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2011
DOI
10.1109/tr.2011.2134371
ISSN
0018-9529