publication venue for
- Elemental mapping at the atomic scale using low accelerating voltages 2010
- Quantification of the Ti oxidation state in BaTi1−xNbxO3 compounds 2010
- Prospects for analyzing the electronic properties in nanoscale systems by VEELS 2008
- Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods available 1995
- Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy. 255:113842-113842. 2024
- Electron ptychography dose reduction using Moiré sampling on periodic structures. 239:113559-113559. 2022
- Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy. 233:113426-113426. 2022
- Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography. 223:113225-113225. 2021
- The performance evaluation of direct detection electron energy-loss spectroscopy at 200 kV and 80 kV accelerating voltages. 212:112942-112942. 2020
- Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy. 209:112858-112858. 2020
- 2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis. 187:1-12. 2018
- Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques. 181:178-190. 2017
- Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction. 180:34-40. 2017
- Real-space mapping of electronic orbitals. 177:26-29. 2017
- Real-space mapping of electronic orbitals. 177:26-29. 2017
- Phase contrast STEM for thin samples: Integrated differential phase contrast. 160:265-280. 2016
- Three-dimensional structure of laser-modified Ti6Al4V and bone interface revealed with STEM tomography. 127:48-52. 2013
- Correcting scanning instabilities from images of periodic structures. 118:67-76. 2012
- Mapping defects in a carbon nanotube by momentum transfer dependent electron energy loss spectromicroscopy. 113:158-164. 2012
- Electron inelastic scattering and anisotropy: The two-dimensional point of view. 106:1082-1090. 2006
- Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope. 106:1091-1103. 2006
- Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM. 106:1076-1081. 2006
- Cholesterol is critical to the integrity of neuronal porosome/fusion pore. 106:674-677. 2006
- Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory. 98:249-257. 2004
- Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy. 96:535-546. 2003
- Optimization of scanning transmission X-ray microscopy for the identification and quantitation of reinforcing particles in polyurethanes. 88:33-49. 2001
- Benefits of energy filtering for advanced convergent beam electron diffraction patterns. 55:276-283. 1994
- Effect of accelerating voltage and thickness on an effective signal-to-noise ratio in electron energy loss spectroscopy. 41:287-290. 1992
- A quadrupole lens system for use in a parallel recording system for Electron Energy Loss Spectroscopy. 28:126-130. 1989
- Electron detection in the analytical electron microscope. 28:108-117. 1989
- Electron-energy-loss-based spectroscopies: A molecular viewpoint. 28:165-183. 1989
- Electron microscope studies of some inorganic and mineral oxide and sulphide systems. 18:211-234. 1985